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KMID : 1102020160460030155
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Applied Microscopy
2016 Volume.46 No. 3 p.155 ~ p.159
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Relationship of the Distribution Thickness of Dielectric Layer on the Nano-Tip Apex and Distribution of Emitted Electrons
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Al-Qudah Ala’a M.
Mousa Marwan S.
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Abstract
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This paper analyses the relationship between the distribution of a dielectric layer on the apex of a metal field electron emitter and the distribution of electron emission. Emitters were prepared by coating a tungsten emitter with a layer of epoxylite resin. A high-resolution scanning electron microscope was used to monitor the emitter profile and measure the coating thickness. Field electron microscope studies of the emission current distribution from these composite emitters (Tungsten-Clark Electromedical Instruments Epoxylite resin [Tungsten/CEI-resin emitter]) have been carried out. Two forms of image have been observed: bright single-spot images, thought to be associated with a smooth substrate and a uniform dielectric layer; and multi-spot images, though to be associated with irregularity in the substrate or the dielectric layer.
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KEYWORD
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Field electron emitter, Dielectric layer, Composite emitter, Field electron microscope, Scanning electron microscope
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